Dp, dn, clkp, and clkn controls, Test parameter summary area, Enabling tests – Teledyne LeCroy MIPI D-PHY User Manual
Page 6

MIPI D-PHY
6
918800 RevA
Mode and Input Selection Area of the MIPI D-PHY
Dialog
As previously mentioned in the MIPI D-PHY Dialog Details (on page 4) topic, the Mode selection affects the
settings the Setup Acquisition button has based on the LP (Low Power) or HS (High Speed) choices.
The selection also controls which tests are presented on the Test Parameter Switchboard and corresponding
Test Dialogs.
Dp, Dn, CLKp, and CLKn Controls
The remaining fields on this section of the MIPI D-PHY Dialog include controls for Dp (Data Positive), Dn (Data
Negative), CLKp (Clock Positive), and CLKn (Clock Negative).
When these fields are selected, a pop-up is shown where you can select your input source for each of the four
required signals.
Test Parameter Summary Area
The Test Parameter Summary area is a section of the MIPI D-PHY dialog showing all the available tests for HS
and LP Modes.
Enabling Tests
Enable/disable a test by either marking/unmarking its respective checkbox from the summary area...
OR
Go directly to its corresponding test dialog and enable/disable it from there.