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Brief hs clock to data timing test descriptions, Official mipi d-phy test algorithms, Lp (low power) tests – Teledyne LeCroy MIPI D-PHY User Manual

Page 11: Brief lp levels test descriptions

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Operator's Manual

918800 RevA

11

 With HS Rise & Fall selected in the Category field, the following Measure values are available:

TR-DATA, TF-DATA, TR-CLK, and TF-CLK.

Note: As mentioned previously in this section, when this category is selected, DATA/CLK-VOD1,
DATA/CLK-VOD0, and Find Levels controls are also shown. Provide values for the additional fields or
use the Find Levels button as desired.

BRIEF HS CLOCK TO DATA TIMING TEST DESCRIPTIONS

Name

Purpose

TR-DATA

To verify that the 20%-80% Rise Time (tR) of the DUT Data & Clock Lanes HS transmitter is

within the conformance limits.

TR-CLK

TF-DATA

To verify that the 80%-20% Fall Time (tF) of the DUT Data & Clock Lanes HS transmitter is

within the conformance limits.

TF-CLK

Official MIPI D-PHY Test Algorithms

Specific test information is maintained by the MIPI Alliance and can be found at

www.mipi.org

.

Note: Registration with the Alliance is required to access the document.

LP (Low Power) Tests

All Dphy1 - 12 dialogs have On, Category, and Measure controls. When the LP Rise & Fall category is selected,
Dn-VOH, Dn-VOL, and Find Levels controls are also shown.

With LP (Low Power) selected as your Mode on the Mode and Input Selection Area of the MIPI D-PHY Dialog
(on page 6), Categories and Measurements on the Dphy1 - 12 dialogs vary in the following manner.

Note: For HS (High Speed) Tests, refer to the HS (High Speed) Tests (on page 8) topic.

Category and Measure Combinations for LP Dphy1 - 12 Dialogs

 With LP Levels selected in the Category field, the following Measure values are available:

VOH-Dp, VOH-Dn, VOH-CLKp, VOH-CLKn, VOL-Dp, VOL-Dn, VOL-CLKp, and VOL-CLKn.