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Conducted emc test system, System 2050 – Atec Teseq-Schaffner-NSG2050 User Manual

Page 4

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Conducted EMC Test System

Technical Specifications

PNW 2051 / 2053

xx

PNW 2051 CCITT

10/700µs and 0.5/700µs, 200V to 6600V

up to 440A

Impedance

15

and40

Pulse rep

10s to 10000s

PNW 2053B

FCC

2/10µs up to 2600V / 1150A

10/160µs up to 2500V / 220A
10/560µs up to 950V / 110A

9/720µs up to 2500V / 50A

Telecom Test System
A range of specialist telecom test plug-in
networks for System 2050 is available for
testing to current telecom standards
around the world, including CCITT, FCC,
IEC, Bellcore and ETSI. There is also a
full set of coupling units available, for
coupling fast transient and surge pulses
to two-wire, four-wire, multi-wire PABX
and ISDN lines.

PNW 2051
generates 10/700µs and 0.5/700µs test
pulses as used in telecom specs such as
CCITT. Normally applied in non-powered
test arrangements, it can also be used
with coupling networks for powered
system tests.

PNW 2053B
provides all pulses required by the new
FCC part 68 standard in one device.
FCC part 68 specifies the test methods
for all classes of terminal equipment in
the telecommunication environment.
The test arrangement includes a
dedicated coupling unit, CDN 141, with a
decoupling network for the 2/10µs power
line test pulse and coupling facilities for
telecom line test applications.

Components’ Test System
Components are often tested in, or close
to, the manufacturing area.
System 2050 offers the required safety
standards and operating flexibility, as well
as ready to use adapters.
Test sequences are prepared by the
system administrator then simply called
into operation by the operator.
Manipulation errors are avoided and the
test results can be recorded
automatically. The system can be used
as a platform for a wide range of test rigs
from a self-contained test bench
arrangement, to complex computer
controlled set-ups with integration of
power sources and measuring equipment.

System 2050