Technical data sheet – Atec Wayne-Kerr-3255B User Manual
Page 3
www.waynekerrtest.com [email protected]
Technical data sheet
Technical specifications
Operation modes
Impedance mode
Inductance (L), Impedance (Z), DC Resistance (Rdc) and
Capacitance (C).
Series or parallel equivalent circuit
Loss term: Quality factor (Q), Dissipation factor (D),
AC Resistance (Rac) and Phase Angle (Ø) Turns Ratio
Percentage difference mode and relative mode on major terms.
Multi-frequency mode
Measurement parameters and test conditions set using
measurement mode. Up to eight frequencies with absolute or
percentage limits on major term with PASS/FAIL indications.
Test conditions
Low level AC drive
For measurement of L + Q, Ls + Rs,
C, Z, Turns Ratio
Frequency ranges
20 Hz to 200 kHz (3255BL)
20 Hz to 500 kHz (3255B)
20 Hz to 1 MHz (3255BQ)
Steps
At least 800 frequency steps are available which may be selected
via the keypad or GPIB.
Basic accuracy of selected frequency ±0.01%
Drive level
Source impedance 50 Ω
1 mV to 10 V rms into open circuit
50 µA to 200 mA rms into short circuit
Automatic Level Control (ALC) maintains level applied to Device
Under Test (DUT) at ±2%, ±1 mV of set voltage or ±2% ±0.1 mA
of set current, reduces to ±4% below 100 Hz.
DC bias current (option)
1mA to 1A DC is available from internal, fast settling bias supply
over full frequency range.
Voltage compliance 14 V minimum
DC Accuracy ±2.5 % ±0.25 mA
Enabling DC bias inherently reduces measurement accuracy.
Safety interlock eliminates operator exposure to high currents.
DC resistance
Low test level of 100 mV minimises heating of the DUT
Short circuit current 10 mA.
Bin handler mode (option)
Sort to 1 of 10 bins using absolute or percentage limits.
Separate Pass/Fail output.
Up to 100 bin limit set-ups stored in non-volatile memory.
TTL interface to external bin handler via 25 way D type
connector.
Option /D1 (non-isolated)
Common 0 V. Bin outputs 0 to 5 V(nominal) with >10 mA
current sink capability.
Option /D2 (isolated)
Common 24 V input. Outputs 0 to 24 V with >10 mA current
source capability.
Measurement speeds
For Impedance, Turns Ratio, DC Resistance
4 speeds selectable for all functions: MAXimum, FAST,
MEDium and SLOW
Maximum for remote control. Up to 20 measurements per
second for test frequency >100 Hz. Selecting slower speeds
improves accuracy and display resolution.
Measurement ranges
R 0.05 mΩ to >2 MΩ
L 1 nH to >1000 H
C 0.01 pF to > 250 mF
Rdc 0.5 mΩ to 50 kΩ
Turns Ratio 100:1 to 1:100
Accuracy
L/C/Z/Turns Ratio ±0.1%
Q ±0.1% (Q+1/Q)
D ±0.001 (1+D2)
Rdc ±0.5% ±1mΩ
Note: Ranges and accuracy vary with measurement speed,
frequency and options chosen