Atec Panametrics-Olympus-Epoch-600 - Manual (Page 5)

5
Optional Software Features
AWS D1.1 and D1.5: Provides a dynamic reflector indication
rating for various AWS weld inspection applications. This allows
more efficient inspections by eliminating manual calculations.
Template Storage: Allows on-screen comparison of a live
waveform with a saved reference waveform. Saved templates can
be dynamically toggled on and off with a single key press for fast
waveform comparison. Gain adjustment feature allows each
saved template a unique base gain for inspections requiring
varying sensitivity levels. Excellent for spotweld analysis and other
applications.
API 5UE: Allows defect sizing according to API Recommended
Practice 5UE. Uses the Amplitude Distance Differential Technique
(ADDT) to measure the size of potential defects during the prove-
up process of OCTG pipe. The measurement process is simple
and repeatable since all ADDT variables are captured from a Peak
Memory envelope.
Waveform Averaging: This feature allows the live A-scan view to
represent an average of successively acquired A-scans. Waveform
averaging improves signal-to-noise ratio when static flaws are
detected. Averaging in 2X, 4X, 8X, 16X, and 32X.
Interface Gate
This optional third measurement gate enables real-time tracking
of a variable interface echo in order to maintain consistent digital
measurements.
Versatility Through Optional Performance
EPOCH 600 Dynamic DGS/AVG Feature
EPOCH 600 Template Storage Feature