Digit thd multimeters, Digit audio analyzing multimeters – Atec Keithley-2015-16 User Manual
Page 3
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A G R E A T E R M E A S U R E O F C O N F I D E N C E
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2015, 2015-P,
6
1
⁄
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-Digit THD Multimeters
2016, 2016-P
6
1
⁄
2
-Digit Audio Analyzing Multimeters
CCIR Weighting Filter
–60
–50
–40
–30
–20
–10
0
10
20
10
100
1000
10000
100000
Frequency (Hz)
Gain (dB)
Figure 5c.
CCITT Weighting Filter
–70
–60
–50
–40
–30
–20
–10
0
10
10
100
1000
10000
Frequency (Hz)
Gain (dB)
Figure 5d.
CCIR/ARM
–60
–50
–40
–30
–20
–10
0
10
20
10
100
1000
10000
100000
Frequency (Hz)
Gain (dB)
Figure 5e.
C–Message Weighting Filter
–60
–50
–40
–30
–20
–10
0
10
20
10
100
1000
10000
Frequency (Hz)
Gain (dB)
Figure 5a.
A Weighting Filter
–60
–50
–40
–30
–20
–10
0
10
20
10
100
1000
10000
100000
Frequency (Hz)
Gain (dB)
Figure 5b.
The Models 2015 and 2015-P have a 4Vrms single-ended output and 8Vrms
differential source output. For tests that require a higher stimulus signal,
the Model 2016 and 2016-P provide a 9.5Vrms single-ended output and a
19Vrms differential output.
Wide Selection of Audio Filters
Five industry-standard bandpass filters are provided for shaping the input
signal for audio and telecommunication applications. Available filters
include the CCITT weighting filter, CCIR filter, C-message filter, CCIR/ARM
filter, and “A” weighting filter (see Figures 5a–5e). The Models 2015, 2015-
P, 2016, and 2016-P provide programmable, high cutoff (low pass) and low
cutoff (high pass) filters. Furthermore, the two filters can be implemented
together to form a bandpass filter. The programmable filters can be used to fil-
ter out noise generated by electromechanical machinery on the production
floor or to simulate other types of system transmission characteristics.
Broad Measurement Flexibility
In addition to their THD, THD+Noise, SINAD, and individual harmonic
measurement capabilities, the instruments provide a comprehensive set of
DMM functions, including DCV, ACV, DCI, ACI, 2W
Ω, 4WΩ, temperature,
frequency, period, dB, dBm, and continuity measurements, as well as
diode testing. This multi-functional design minimizes added equipment
costs when configuring test setups.