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Atec EM-Test-CWS500N2 User Manual

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DATA SHEET > CWS 500N2 > 20120604

TECHNICAL DETAILS

BULK CURRENT INJECTION AS PER ISO 11452-4

Output level

As required in ISO 11452-4, using
closed loop or substitution method

BULK CURRENT INJECTION AS PER MIL 461 CS 114

Output level

As required in MIL 461 CS 114, using
the closed loop method

MEASUREMENTS FOR BULK CURRENT INJECTION

Directional
coupler

Included to measure forward power
and reverse power

Forward power

Internal power meter #1

Reverse power

Internal power meter #2

Injected current

Internal power meter #3

TEST ROUTINES FOR BULK CURRENT INJECTION

ISO 11452-4

Operation via icd.control

MIL 461 CS114

Operation via icd.control

IEC 61000-4-6

Output level

1V - 30Vrms (emf)
all standard test levels are
guaranteed with all coupling
methods

MEASUREMENTS, IEC 61000-4-6

Cal in (BNC)

Integrated power meter to record the
calibration data of a coupling device

Injected current

Measured by internal power meter

RF indicator

LED indicating the RF output status

LCD

Display of the test level and the
preselected frequency value

TEST ROUTINES FOR IEC 61000-4-6

Quick Start

Immediate start; easy-to-use and
fast test routine

User Test routines

Frequency sweep

Service

Service, Set-up

OUTPUT

RF output

N connector at the front panel

Ouptut power

Built-in amplifier
50dBm (9kHz - 400MHz) at 1dB
compression.

Gain amplifier

> 50dB

Output impedance

50ohm

Harmonic
distortion

< -20dBc at max. power

Insertion loss

Approx. 1dB (directional coupler +
RF relay)

TIME PARAMETERS

Dwell time

td = 0.3s - 9,999s

Pause time

tr = 0/0.3s - 9,999s

TEST FREQUENCIES

Frequency range

9kHz - 400MHz (built-in amplifier)
9kHz - 1,000MHz (ext. amplifier)

Unmodulated
signal

CW (continuous wave)

Amplitude
modulation

1kHz, 80% AM (EN/IEC 61000-4-6)
1kHz, 95% AM (automotive)
400Hz, 80% AM
50Hz, 80% AM (automotive)
2Hz, 80% AM (IEC 60601-1-2)

Pulse modulation

1Hz, 50% duty cycle (EN 50130-4)
1kHz, 50% duty cycle (MIL 461)

INTERFACE

Serial interface

USB

Parallel interface

IEEE 488, addresses 1 - 30

Fail 1

BNC input; test will be stopped
(active low)

Fail 2

BNC input; test status will be saved
(max. 10 events) when active low.
Test continues

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