Tri-state test circuit and waveforms – Rainbow Electronics ADC12662 User Manual

Page 5

Note 9

Integral Linearity Error is the maximum deviation from a straight line between the

measured offset and full scale endpoints

Note 10

Dynamic testing of the ADC12662 is done using the ADC IN input The input multiplexer adds harmonic distortion at high frequencies See the graph in the

Typical Performance Characteristics section for a typical graph of THD performance vs input frequency with and without the input multiplexer

Note 11

The signal-to-noise ratio is the ratio of the signal amplitude to the background noise level Harmonics of the input signal are not included in its calculation

Note 12

The contributions from the first nine harmonics are used in the calculation of the THD

Note 13

Effective Number of Bits (ENOB) is calculated from the measured signal-to-noise plus distortion ratio (SINAD) using the equation ENOB

(SINAD

1 76) 6 02

Note 14

The digital power supply current takes up to 10 seconds to decay to its final value after PD is pulled low This prohibits production testing of the standby

current Some parts may exhibit significantly higher standby currents than the 50 mA typical

Note 15

Power Supply Sensitivity is defined as the change in the Offset Error or the Full Scale Error due to a change in the supply voltage

TRI-STATE Test Circuit and Waveforms

TL H 11876 – 2

TL H 11876 – 3

TL H 11876 – 4

TL H 11876 – 5