C&H Technology 128 SAL-RPM - Manual (Page 6)

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Revision: 31-Aug-09 157
128 SAL-RPM
Aluminum Capacitors Solid Al,
Radial Pearl Miniature
Vishay BCcomponents
CAPACITANCE (C)
LEAKAGE CURRENT
TYPICAL CAPACITANCE CHANGE AFTER
ENDURANCE TEST AT T
AMB
= 125
°C
TYPICAL LEAKAGE CURRENT CHANGE
AFTER ENDURANCE TEST AT T
AMB
= 125
°C
T
amb
(°C)
Fig.6 Typical multiplier of capacitance and standard deviation
as functions of ambient temperature
0.6
0.7
0.8
0.9
1.0
1.1
1.2
C
0
C
- 80 - 40 0 40 80 120 160
0.05
0
standard de
v
iation
σ
σ
10 2
10
1
10
-1
I
I
0
T
amb
(°C)
Fig.8 Typical multiplier of leakage current as a function
of ambient temperature
- 40 0 40 80 120 160
I
0
= leakage current during continuous operation
at U
R
and T
amb
= 25 °C
Fig.7 Change of capacitance as a function of cumulative
frequency after endurance test
0.01 0.1 0.5 1 2 5 10 20 30 40 50 60 70 80 90 95 98 99 99.5 99.9 99.99
2000 h
5000 h
10 000 h
ΔC
(%)
cumulative frequency (%)
4
2
0
- 2
- 4
- 6
- 10
- 8
Fig.9 Change of capacitance as a function of cumulative
frequency after endurance test
0.01 0.1 0.5 1 2 5 10 20 30 40 50 60 70 80 90 95 98 99 99.5 99.9 99.99
cumulative frequency (%)
leakage c
u
rrent (
%
of initial re
qu
irements)
100
80
60
50
40
30
20
10
8
6
5
4
3
2
1
init.
2000 h
5000 h
10 000 h