Paradyne 3510 - Manual (Page 28)

COMSPHERE 3500 Series Data Service Units
3-6 March 1999 3510-A2-GN32-60
Device Test
Device Test is a data disruptive test that tests the
functionality of the DSU.
Device Test Overview
This 30-second test uses a test pattern generator built
into the DSU. The test does not require any other
equipment. The generator sends a test message to the
DSU transmitter where it is looped back to the receiver
(Figure 3-3). The receiver then passes the test message it
receives to the comparator. The comparator checks the
received message for errors. Errors cause the faceplate
Dsbl/Fail (3511) or FAIL/STR/DSBL (3510) indicator to
flash. At the conclusion of the test, the PASS or FAIL
indicator lights.
To start the test, press the LL and TP test switches. To
end the test, press the TP and LL test switches after the
test result indicator appears.
Figure 3-3. Device Test Diagram