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Digital i/o – Measurement Computing USB-1608FS User Manual

Page 20

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USB-1608FS User's Guide

20

Table 3. Accuracy components - All values are (±)

Range

% of Reading

Gain error at FS (mV)

Offset (mV)

±10 V

0.04

4.00

1.66

±5 V

0.04

2.00

0.98

±2 V

0.04

0.80

0.51

±1 V

0.04

0.40

0.28

Table 4 summarizes the noise performance for the USB-1608FS. Noise distribution is determined by gathering
50 k samples with inputs tied to ground at the user connector. Samples are gathered at the maximum specified
sampling rate of 50 kS/s.

Table 4. Noise performance

Range

Typical counts

LSBrms

±10 V

10

1.52

±5 V

10

1.52

±2 V

11

1.67

±1 V

14

2.12

Digital I/O

Table 5. Digital I/O specifications

Parameter

Specification

Digital type

CMOS

Number of I/O

8 (DIO0 through DIO7)

Configuration

Independently configured for input or output

Pull-up/pull-down configuration

All pins pulled up to 5V via 47 k

Ω resistors (default).

Hardware revisions E and later may be changed to pull-down using an internal
user-configurable jumper.
Previous revisions can be configured for pull-down at the factory.

Input high voltage threshold

2.0 V min

Input high voltage limit

5.5 V absolute max

Input low voltage threshold

0.8 V max

Input low voltage limit

–0.5 V absolute min
0 V recommended min

Output high voltage
(IOH = –2.5 mA)

3.8 V min

Output low voltage
(IOL = 2.5 mA)

0.44 V max

Power on and reset state

Input