KYORITSU 6010B - Manual (Page 27)

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8.6.2 "FAST TRIP" Test
RCDs rated at 30 mA or less are sometimes used to provide extra protection
against electric shock. Such RCDs require a special test procedure as follows:-
1．Set the function switch to "X1
FAST
" and the IΔN select switch to "FAST 150".
2．Set the phase angle to indicate 0° in the display.
3．Connect the instrument to the RCD to be tested.
4．Make sure that the P-E and P-N wiring check LEDs are lit. If they are not,
disconnect the tester and check the wiring for a possible fault.
5．If the LEDs are lit, press the test button to apply a test current of 150mA
where the RCD should trip within 40ms, the tripping time being shown on
the LCD.
6．Change the phase angle to 180° and repeat the test.
7．MAKE SURE TO KEEP CLEAR OF EARTHED METAL
DURING THE OPERATION OF THIS TEST.
8.6.3 Testing DC sensitive RCDs " "
KEW 6010B has a facility to test RCDs that are sensitive to DC fault current.
Proceed as follows:
1．Set the function switch to "DC" and the IΔN select switch to the rated
residual operating current of the RCD under test.
2．Set the phase angle to indicate 0° in the display.
3．Set the UL value 50V or 25V.
4．Connect the instrument to the RCD to be tested.
5．Check the wiring as 8.6.1 or 8.6.2.
6．Press the test button. The RCD should trip. Check the Trip Time.
8.6.4 Testing Auto Ramp " "
KEW 6010B has a facility to test the current that are tripped the RCD under test.
Proceed as follows:
1．Set the function switch to "Auto Ramp" and the IΔN select switch to the
rated residual operating current of the RCD under test.
2．Set the phase angle.
3．Set the UL value 50V or 25V.
4．Connect the instrument to the RCD to be tested.
5．Check the wiring as 8.6.1 or 8.6.2.
6．Press the test button.
The Test current goes up by 10% from 20% to 110% of the selected IΔN.
The RCD should trip. Check the Trip Out Current.