Atec Panametrics-Olympus-Epoch-LTC - Manual (Page 3)

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Standard dynamic DAC/TVG: Calculates
signal amplitude as a percentage or decibel
level compared to a DAC curve or a refer-
ence echo amplitude fixed at a time-varied
gain. DAC versions include ASME, ASME
3, JIS, and Custom. Also includes several
key features: dynamically adjustable DAC
curves, switchable DAC and TVG views,
and custom DAC warning curves.
Standard onboard DGS/AVG: Flaw sizing
technique allowing echo signals to be
evaluated with a DGS/AVG diagram as-
sociated to a particular type of probe and
material. The DGS/AVG diagram illustrates
the relationships between echo height, flaw
size, and distance from the transducer
Gate 2 (Echo-to-Echo): Allows
Gate 2 measurements, Echo-to-Echo
measurements, and Gate 2 alarms
CSC (Curved Surface Correction):
Corrects sound path information when using
an angle beam transducer to circumferen-
tially inspect a curved surface.
Software Options
Manual PRF control: Allows operators to
manually adjust the EPOCH LTC’s pulse
repetition frequency (PRF) from 10 Hz to
500 Hz in 10-Hz increments
Extended range: Extends the standard range
of the EPOCH LTC to 3.36 mm to 13,404
mm (0.132 in. to 527 in.) at 5900 m/s
(0.2320 in./ms) Includes Low Pass filter
(0.5 MHz to 4.0 MHz).
Tunable square wave pulser: Allows
operators to tune the pulse width of the
square wave pulser to optimize transducer
performance. This maximizes signal-to-
noise ratio and penetration in difficult
materials.
AWS D1.1 and D1.5: Provides a dynamic
reflector indication rating for various AWS
weld inspection applications. This allows
more efficient inspections by eliminating
manual calculations .
API 5UE: Allows defect sizing according to
API Recommended Practice 5UE. Uses the
Amplitude Distance Differential Technique
(ADDT) to measure the size of potential
defects during the prove-up process of
OCTG pipe. The measurement process
is simple and repeatable since all ADDT
variables are captured from a Peak Memory
envelope.
Advanced Software Features and Data Management
Instrument Inputs/Outputs
USB USB On-The-Go port for PC communication, printing, and data storage.
VGA ouput port Standard
miniSD miniSD Card slot for data storage.
RS-232 port Yes
Data Storage
Capable of storing up to 50,000 IDs with waveforms, measurements, and
configuration parameters in the onboard memory. The miniSD Card allows
virtually unlimited data storage.
GageView Pro
The optional GageView TM Pro interface
program helps manage and format stored
inspection data. Data can be printed or
easily copied to word processing files and
spreadsheets for further reporting needs.
GageView Pro also allows creating custom-
ized databases of identifier (ID) strings that
can be uploaded to the EPOCH LTC. The
program is fully compatible with the
EPOCH LT, XT, 600 and the 1000 Series.
With GageView Pro operators can:
• Export thickness or amplitude data
saved on the EPOCH to Microsoft Excel,
Word, or similar programs
• Create, format, and manage test
databases
• Import and export configurations
between the EPOCH and a computer
• Create custom DGS probe libraries
• Upgrade the EPOCH operating software
Software option API 5UE allows defect sizing according to API
Recommended Practice 5UE