Atec Com-Power-PS-500 - Manual

Description
The PS-500 is a Near Field Probe set consist four
probes and a custom storage case. Performance and
ease of use were designed into this product. The unique
design allows easy access for tight or hard to reach
places while reducing the effect of hand position or
cable placement.
The fi ne tip and the contac tip probe are a precision
E-fi eld probes that features the ability to singularly
identify a problem trace or pin. The fi ne tip probe is
designed to be extremely sensitive to distance from
the source which allows easy discrimination between
traces on a PCB. The unique patented design allows
measurement on individual traces as narrow as 3 mils.
The contact tip probe allows direct electrical contact
with the circuit. It has wider frequency range than the
fi ne tip probe. Just like the fi ne tip probe the contact
tip probe allow fi nding noise source to a trace or pin.
The broadband probe is designed to identify E-fi elds
over a broad frequency range.
The H-fi eld probe's magnetic loop design makes it ideal
for isolating sources of magnetic noise. The shielded
loop construction allows measurement to minimize
the effect of electrical fi elds.
Application
The PS-500 Near Field Probe Set is designed to assist
in troubleshooting EMI problems both at the board
level and at the component level. It is used to detect
radiation from cables, cases, traces and ICs.
Typically the broadband probe is used to locate the
general area of emission. Then the tip probe is used
to isolate the source to a specifi c trace or pin. Further
analysis can be done using the contact tip probe by
making direct contact with the curcuit and then follow-
ing the noisy trace to fi nd the cause of emissions such
as a broken transmission line or impedance mismatch.
A typical use for the H-fi eld probe is to verify the in-
tegrity of the chassis of your computer. This is done
by moving the probe along the seams of the chassis
which may be acting as slot antennas. This probe is
also very useful for detecting magnetic noise sources
such as large current switching circuits or transformers.
By utilizing the appropriate probes, potential certifi ca-
tion problems can be discovered and addressed before
expensive compliance testing is done. This saves both
money and valuable time. The net result is a reduction
in testing costs and a decreased time to market.
Features
Complete Solution - Includes E and H fi eld probes
Contact tip probe - Make contact with the circuit
Locate Noise Source - Down to a pin with the fi ne tip
Lightweight - Easy to use and handle
Small Size - Allows easy access to corners
Sensitive to Tip Position - Ease of pinpointing source
Immune to Hand Position - For repeatable results
Optional preamplifi er
PS-500
Near Field Probe Set
Com-Power Corporation (949) 587 - 9800 www. com-power.com [email protected]