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Zxmn4a06g advanced information, Electrical characteristics, Zxmn4a06g – Diodes ZXMN4A06G User Manual

Page 3

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ZXMN4A06G

Document number: DS33545 Rev. 3 - 2

3 of 7

www.diodes.com

January 2014

© Diodes Incorporated

ZXMN4A06G

ADVANCED INFORMATION



Electrical Characteristics

(@T

A

= +25°C, unless otherwise specified.)

Characteristic Symbol

Min

Typ

Max

Unit

Test

Condition

OFF CHARACTERISTICS
Drain-Source Breakdown Voltage

BV

DSS

40

V

I

D

= 250µA, V

GS

= 0V

Zero Gate Voltage Drain Current

I

DSS

1 µA

V

DS

= 40V, V

GS

= 0V

Gate-Source Leakage

I

GSS

100

nA

V

GS

=

20V, V

DS

= 0V

ON CHARACTERISTICS
Gate Threshold Voltage

V

GS(th)

1

2 V

I

D

= 250

A, V

DS

= V

GS

Static Drain-Source On-Resistance (Note 9)

R

DS(ON)

0.05

V

GS

= 10V, I

D

= 4.5A

0.075

V

GS

= 4.5V, I

D

= 3.2A

Forward Transconductance (Notes 11)

g

fs

8.7

S

V

DS

= 15V, I

D

= 2.5A

Diode Forward Voltage (Note 9)

V

SD

0.8 0.95 V

I

S

= 2.5A, V

GS

= 0V, T

J

= +25°C

Reverse recovery time (Note 11)

t

rr

19.86

ns

I

F

= 2.5A, di/dt = 100A/µs,

T

J

= +25°C

Reverse recovery charge (Note 11)

Q

rr

16.36

nC

DYNAMIC CHARACTERISTICS (Note 10)
Input Capacitance

C

iss

770

pF

V

DS

= 40V, V

GS

= 0V

f = 1MHz

Output Capacitance

C

oss

92

pF

Reverse Transfer Capacitance

C

rss

61

pF

Total Gate Charge (Note 11)

Q

g

18.2

nC

V

DS

= 30V, V

GS

= 10V,

I

D

= 2.5A

(refer to test circuit)

Gate-Source Charge (Note 11)

Q

gs

2.1

nC

Gate-Drain Charge (Note 11)

Q

gd

4.5

nC

Turn-On Delay Time (Note 11)

t

D(on)

2.55

ns

V

DD

= 30V, V

GS

= 10V

I

D

= 2.5A, R

G

 6Ω

(refer to test circuit)

Turn-On Rise Time (Note 11)

t

r

4.45

ns

Turn-Off Delay Time (Note 11)

t

D(off)

28.61

ns

Turn-Off Fall Time (Note 11)

t

f

7.35

ns

Notes:

9. Measured under pulsed conditions. Pulse width

 300µs; duty cycle  2%.

10. Switching characteristics are independent of operating junction temperatures.

11. For design aid only, not subject to production testing.