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Electrical characteristics, Zxmd63n03x – Diodes ZXMD63N03X User Manual

Page 4

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ZXMD63N03X

Document number: DS33501 Rev. 2 - 2

4 of 8

www.diodes.com

March 2014

© Diodes Incorporated

ZXMD63N03X




Electrical Characteristics

(@T

A

= +25°C, unless otherwise specified.)

Characteristic

Symbol

Min

Typ

Max

Unit

Test Condition

OFF CHARACTERISTICS
Drain-Source Breakdown Voltage

BV

DSS

30 —

— V

V

GS

= 0V, I

D

= 250μA

Zero Gate Voltage Drain Current T

J

= +25°C

I

DSS

1.0 µA

V

DS

= 30V, V

GS

= 0V

Gate-Source Leakage

I

GSS

100 nA

V

GS

= ±20V, V

DS

= 0V

ON CHARACTERISTICS
Gate Threshold Voltage

V

GS(th)

1.0 —

V

V

DS

= V

GS

, I

D

= 250μA

Static Drain-Source On-Resistance (Note 11)

R

DS (ON)

135

mΩ

V

GS

= 10V, I

D

= 1.7A

200

V

GS

= 4.5V, I

D

= 0.85A

Forward Transconductance (Notes 11 & 13)

g

fs

1.9 —

— S

V

DS

= 10V, I

D

= 0.85A

Diodes Forward Voltage (Note 11)

V

SD

— —

0.95 V

T

J

= 25°C, I

S

= 1.7A, V

GS

= 0V

DYNAMIC CHARACTERISTICS
Input Capacitance (Note 12 & 13)

C

iss

290 —

pF

V

DS

= 25V, V

GS

= 0V,

f = 1.0MHz

Output Capacitance (Notes 12 & 13)

C

oss

70 —

Reverse Transfer Capacitance (Notes 12 & 13)

C

rss

20 —

Total Gate Charge (Notes 12 & 13)

Q

g

8

nC

V

GS

= 10V, V

DS

= 24V,

I

D

= 1.7A

Gate-Source Charge (Notes 12 & 13)

Q

gs

1.2

Gate-Drain Charge (Notes 12 & 13)

Q

gd

2

Reverse Recovery Time (Note 13)

t

rr

16.9 —

ns

T

J

= +25°C, I

F

= 1.7A,

di/dt = 100A/µs

Reverse Recovery Charge (Note 13)

Q

rr

9.5 —

nC

Turn-On Delay Time (Notes 12 & 13)

t

D(on)

2.5 —

ns

V

DD

= 15V, I

D

= 1.7A,

R

G

= 6.1Ω, R

D

= 8.7Ω,

Turn-On Rise Time (Notes 12 & 13)

t

r

4.1 —

Turn-Off Delay Time (Notes 12 & 13)

t

D(off)

9.6 —

Turn-Off Fall Time (Notes 12 & 13)

t

f

4.4 —

Notes:

11. Measured under pulsed conditions. Pulse width

 300s; duty cycle 2%.

12. Switching characteristics are independent of operating junction temperature.
13. For design aid only, not subject to production testing.