Nemco Electronics Performance Info - Manual (Page 11)

General Performance Information
Radial Dipped
z Life test Our regular quality assurance program requires
capacitors be subjected to +85°C at rated voltage and
+125°C at 2/3 x rated voltage for 2000 hours with 3 ohms
circuit impedance. The capacitors must meet the following
limits after stabilizing for 1 - 2 hours at room temperature.
z Humidity life test Capacitors shall be capable of
withstanding 1000 hours at +55°C with 95% RH and rated
voltage applied. The capacitors must meet the following
limits after stabilizing for 24 hours at 25°C.
z Thermal Shock Test Capacitors are subjected to 5 cycles
of 30 minute durations at -55°C followed by 30 minutes at
+125°C. The capacitors must meet the following limits after
stabilizing at 25°C.
z Surge Current Capacitors shall withstand 3 consecutive
cycles. The capacitors are charged approximately 4
seconds at rated voltage thru a low circuit resistance of
approximately 1 ohm @ +25°C followed by a discharge to
below 1% of rated voltage. Post test readings must meet
the following criteria:
z Surge Voltage Test Surge voltage tests are performed at
+25°C, +85°C and +125°C. The capacitors shall be applied
a surge voltage in series with a 33
Ω resistor at a cycle of .5
minutes “on” and 5.5 minutes “off” repeating 1000 times at
+85°C. After stabilizing at room temperature the
capacitor must meet the following limits.
capacitance change within +/-10% of the initial value
Tan δ (DF) within the initial value
DC leakage current within 125% of the initial value
capacitance change within +/-10% of the initial value
Tan δ (DF) less than 2X the initial limit
DC leakage current less than 5X the initial limit
capacitance change within +/-5% of the initial value
Tan δ (DF) within the initial limit
DC leakage current within 125% of the initial limit
capacitance change less than +/-5% of the initial value
Tan δ (DF) within the initial limit
DC leakage current within the initial limit
capacitance change within +/-10% of the initial value
Tan
δ
(DF) within the initial limit
DC leakage current within the initial limit