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Vishay semiconductor italy, Irr ( a ) di, Dt (a/μs ) fig. 9 - typical stored current vs. di – C&H Technology UFL200FA60P User Manual

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UFL200FA60P

Vishay Semiconductor Italy

www.vishay.com

5

Document Number: I27322
Revision 30-Oct-07

100

1000

0

10

20

30

40

50

If = 50A, 125°C

If = 50A, 25°C

Vr = 200V

Irr ( A )

di

F

/dt (A/μs )

Fig. 9 - Typical Stored Current vs. di

F

/dt

Fig. 11 - Reverse Recovery Waveform and Defini-

tions

Fig. 10 - Reverse Recovery Parameter Test

Circuit

IRFP250

D.U.T.

L = 70µH

V = 200V

R

0.01 Ω

G

D

S

dif/dt

ADJUST

4. Q

rr

- Area under curve defined by

t

rr

and I

RRM

5. di

(rec) M

/ dt - Peak rate of change

of current during t

b

portion of t

rr

1. di

F

/dt - Rate of change of current through

zero crossing

2. I

RRM

- Peak reverse recovery current

3. t

rr

- Reverse recovery time measured from

zero crossing point of negative going I

F

to

point where a line passing through 0.75 I

RRM

and 0.50 I

RRM

extrapolated to zero current

Q

rr =

t rr x I

RRM

2

t

a

t

b

t

rr

Q

rr

I

F

I

RRM

I

RRM

0.5

di(rec)M/dt

0.75 I

RRM

5

4

3

2

0

1

di /dt

f