C&H Technology VS-GT175DA120U - Manual (Page 8)

VS-GT175DA120U
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Vishay Semiconductors
Revision: 02-Aug-12 7 Document Number: 93990
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Fig. 19a - Clamped Inductive Load Test Circuit Fig. 19b - Pulsed Collector Current Test Circuit
Fig. 20a - Switching Loss Test Circuit
Fig. 20b - Switching Loss Waveforms Test Circuit
* Driver same type as D.U.T.; V
C
= 80 % of V
ce(max)
* Note: Due to the 50 V power supply, pulse width and inductor
will increase to obtain Id
50 V
1000 V
D.U.T. L
V
C
*
2
1
R
g
V
CC D.U.T.
R =
V
CC
I
CM
+
-
L
Diode clamp/
D.U.T.
D.U.T./
driver
- 5 V
+ -
R
g
V
CC
+
-
t = 5 µs t
d(on)
t
f t
r
90 %
t
d(off)
10 %
90 %
10 %
5 %
V
C
I
C
E
on
E
off
E
ts
= (E
on
+ E
off
)
1
2
3