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Zxmhc3a01n8 – Diodes ZXMHC3A01N8 User Manual

Page 4

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ZXMHC3A01N8

Issue 1.0 - March 2009 4

© Diodes Incorporated

www.diodes.com

N-channel electrical characteristics (at T

amb

= 25°C unless otherwise stated)

Parameter Symbol

Min.

Typ.

Max.

Unit

Conditions

Static

Drain-Source breakdown
voltage

V

(BR)DSS

30 V

I

D

= 250

μA, V

GS

= 0V

Zero Gate voltage Drain
current

I

DSS

0.5

µA

V

DS

= 30V, V

GS

= 0V

Gate-Body leakage

I

GSS

±

100

nA

V

GS

=

±20V, V

DS

= 0V

Gate-Source threshold
voltage

V

GS(th)

1.0 3.0

V

I

D

= 250

μA, V

DS

= V

GS

Static Drain-Source

on-state resistance

(a)

R

DS(on)

0.125

0.180

V

GS

= 10V, I

D

= 2.5A

V

GS

= 4.5V, I

D

= 2.0A

Forward

Transconductance

(a) (c)

g

fs

3.5

S

V

DS

= 15V, I

D

= 2.5A

Dynamic

Capacitance

(c)

Input capacitance

C

iss

190

pF

V

DS

= 25V, V

GS

= 0V

f= 1MHz

Output capacitance

C

oss

38

pF

Reverse transfer
capacitance

C

rss

20 pF

Switching

(b) (c)

Turn-on-delay time

t

d(on)

1.7 ns

V

DD

= 15V, V

GS

= 10V

I

D

= 2.5A

R

G

≅ 6.0Ω,

Rise time

t

r

2.3 ns

Turn-off delay time

t

d(off)

6.6 ns

Fall time

t

f

2.9 ns

Gate charge

(c)

Total Gate charge

Q

g

3.9 nC

V

DS

=15V, V

GS

= 10V

I

D

= 2.5A

Gate-Source charge

Q

gs

0.6 nC

Gate-Drain charge

Q

gd

0.9 nC

Source–Drain diode

Diode forward voltage

(a)

V

SD

0.95

V

I

S

= 1.25A, V

GS

= 0V

Reverse recovery time

(c)

t

rr

17.7 ns

I

S

= 2.5A, di/dt= 100A/

μs

Reverse recovery charge

(c)

Q

rr

13.0 nC

NOTES:

(a) Measured under pulsed conditions. Pulse width

≤ 300μs; duty cycle ≤ 2%.

(b) Switching characteristics are independent of operating junction temperature.
(c) For design aid only, not subject to production testing