Description of pin functions, 1 0 functional description – Rainbow Electronics ADC0820 User Manual
Page 7

Description of Pin Functions
Pin Name
Function
1
V
IN
Analog input range eGND
s
V
IN
s
V
CC
2
DB0
TRI-STATE data output
bit 0 (LSB)
3
DB1
TRI-STATE data output
bit 1
4
DB2
TRI-STATE data output
bit 2
5
DB3
TRI-STATE data output
bit 3
6
WR RDY WR-RD Mode
WR
With CS low the conversion is start-
ed on the falling edge of WR Approxi-
mately 800 ns (the preset internal time
out t
I
) after the WR rising edge the result
of the conversion will be strobed into the
output latch provided that RD does not
occur prior to this time out (see
Figures
3a
and
3b
)
RD Mode
RDY
This is an open drain output (no in-
ternal pull-up device) RDY will go low af-
ter the falling edge of CS RDY will go
TRI-STATE when the result of the conver-
sion is strobed into the output latch It is
used to simplify the interface to a micro-
processor system (see
Figure 2
)
7
Mode
Mode
Mode selection input
it is inter-
nally tied to GND through a 50 mA current
source
RD Mode
When mode is low
WR-RD Mode
When mode is high
8
RD
WR-RD Mode
With CS low the TRI-STATE data outputs
(DB0-DB7) will be activated when RD
goes low (see
Figure 4
) RD can also be
used to increase the speed of the con-
verter by reading data prior to the preset
internal time out (t
I
E
800 ns) If this is
done the data result transferred to output
latch is latched after the falling edge of
the RD (see
Figures 3a
and
3b
)
RD Mode
With CS low the conversion will start with
RD going low also RD will enable the
TRI-STATE data outputs at the comple-
tion of the conversion RDY going TRI-
STATE and INT going low indicates the
completion of the conversion (see
Figure
2
)
Pin Name
Function
9
INT
WR-RD Mode
INT going low indicates that the conver-
sion is completed and the data result is in
the output latch INT will go low E800 ns
(the preset internal time out t
I
) after the
rising edge of WR (see
Figure 3b
) or INT
will go low after the falling edge of RD if
RD goes low prior to the 800 ns time out
(see
Figure 3a
) INT is reset by the rising
edge of RD or CS (see
Figures 3a
and
3b
)
RD Mode
INT going low indicates that the conver-
sion is completed and the data result is in
the output latch INT is reset by the rising
edge of RD or CS (see
Figure 2
)
10 GND
Ground
11 V
REF
(b) The bottom of resistor ladder voltage
range GND
s
V
REF
(b)
s
V
REF
(a) (Note
5)
12 V
REF
(a) The top of resistor ladder voltage range
V
REF
(b)
s
V
REF
(a)
s
V
CC
(Note 5)
13 CS
CS must be low in order for the RD or WR
to be recognized by the converter
14 DB4
TRI-STATE data output
bit 4
15 DB5
TRI-STATE data output
bit 5
16 DB6
TRI-STATE data output
bit 6
17 DB7
TRI-STATE data output
bit 7 (MSB)
18 OFL
Overflow output
If the analog input is
higher than the V
REF
(a) OFL will be low
at the end of conversion It can be used to
cascade 2 or more devices to have more
resolution (9 10-bit) This output is always
active and does not go into TRI-STATE
as DB0 – DB7 do
19 NC
No connection
20 V
CC
Power supply voltage
1 0 Functional Description
1 1 GENERAL OPERATION
The ADC0820 uses two 4-bit flash A D converters to make
an 8-bit measurement (
Figure 1
) Each flash ADC is made
up of 15 comparators which compare the unknown input to
a reference ladder to get a 4-bit result To take a full 8-bit
reading one flash conversion is done to provide the 4 most
significant data bits (via the MS flash ADC) Driven by the 4
MSBs an internal DAC recreates an analog approximation
of the input voltage This analog signal is then subtracted
from the input and the difference voltage is converted by a
second 4-bit flash ADC (the LS ADC) providing the 4 least
significant bits of the output data word
The internal DAC is actually a subsection of the MS flash
converter This is accomplished by using the same resistor
ladder for the A D as well as for generating the DAC signal
The DAC output is actually the tap on the resistor ladder
which most closely approximates the analog input In addi-
tion the ‘’sampled-data’’ comparators used in the ADC0820
provide the ability to compare the magnitudes of several
analog signals simultaneously without using input summing
amplifiers This is especially useful in the LS flash ADC
where the signal to be converted is an analog difference
7