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Test circuits – Philips SA5223 User Manual

Page 4

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Philips Semiconductors

Product specification

SA5223

Wide dynamic range AGC transimpedance amplifier(150MHz)

1995 Oct 24

4

TEST CIRCUITS

Test Circuit 1: Bandwidth

NETWORK ANALYZER

S-PARAMETER TEST SET

PORT1

PORT2

V

CC

.1uF

.1uF

50

Z

O

=

50

OUT

OUT

IN DUT

0.1uF

R=1k

50

GND

1

SINGLE-ENDED

GND

2

R

TSE

+

12.4

@

S

21

@

R

IN

,

R

IN

+

1k

)

R

INSS

[

1250

W

Z

O

=

50

SD00370

500

500

Test Circuit 2: Noise

SPECTRUM ANALYZER

V

CC

OUT

OUT

IN DUT

GND

2

GND

1

NE5209

50

.1

µ

F

.1

µ

F

1.0

µ

F

1.0

µ

F

C

S

50

SD00371

NETWORK ANALYZER

S-PARAMETER TEST SET

PORT1

PORT2

V

CC

.1uF

.1uF

OUT

OUT

IN DUT

GND

2

GND

1

50

CAL

UNBAL.

0.1uF

NC

50

BIAS TEE

5V

NHO300HB

TRANSFORMER

CONVERSION

LOSS = 9dB

100

BAL.

SD00372

Test Circuit 3: PSRR

Test Circuit 4: Duty Cycle Distortion

PULSE GEN

OUT

OUT

DUT

OSCILLOSCOPE

A

B

Meaurement done using
differential wave forms

5V

0.1uF

.1

µ

F

.1

µ

F

GND

1

GND

2

Z

O

= 50

Z

O

= 50

IN

500

500

1k

50

OFFSET

SD00373

50% DUTY CYCLE