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Dc electrical characteristics, Ac electrical characteristics – Philips SA5223 User Manual

Page 3

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Philips Semiconductors

Product specification

SA5223

Wide dynamic range AGC transimpedance amplifier(150MHz)

1995 Oct 24

3

DC ELECTRICAL CHARACTERISTICS

Typical data and Min and Max limits apply at T

A

= 25

°

C, and V

CC

= +5V, unless otherwise specified.

SYMBOL

PARAMETER

TEST CONDITIONS

SA5223

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

Min

Typ

Max

UNIT

V

IN

Input bias voltage

1.3

1.55

1.8

V

V

O

±

Output bias voltage

2.9

3.2

3.5

V

V

OS

Output offset voltage (V

PIN6

- V

PIN7

)

-200

80

+200

mV

I

CC

Supply current

15

22

29

mA

I

OMAX

Output sink/source current

1.5

2

mA

NOTE: Standard deviations are estimated from design simulations to represent manufacturing variations over the life of the product.

AC ELECTRICAL CHARACTERISTICS

Typical data and Min and Max limits apply at T

A

= 25

°

C and V

CC

= +5V, unless otherwise specified.

SYMBOL

PARAMETER

TEST CONDITIONS

SA5223

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

Min

Typ

Max

UNIT

R

T

Transresistance (differential output)

DC tested, R

L

=

, I

IN

= 0-1

µ

A

90

125

160

k

R

T

Transresistance
(single-ended output)

DC tested, R

L

=

, I

IN

= 0-1

µ

A

45

62.5

80

k

R

O

Output resistance
(differential output)

DC tested

140

R

O

Output resistance
(single-ended output)

DC tested

70

f

3dB

Bandwidth (-3dB)

Test Circuit 1

110

150

MHz

R

IN

Input resistance

DC tested

250

C

IN

Input capacitance

1

0.7

pF

C

INT

Input capacitance including Miller multiplied
capacitance

4.0

pF

R/

V

Transresistance power supply sensitivity

V

CC1

= V

CC2

= 5

±

0.5V

3

%/V

R/

T

Transresistance ambient temperature sensi-
tivity

T

A

= T

A MAX

- T

A MIN

0.09

%/

o

C

I

IN

RMS noise current spectral density (referred
to input)

2

Test Circuit 2, f = 10MHz

1.17

pA

ń Hz

Ǹ

Integrated RMS noise current over the band-

idth (referred to inp t)

Test circuit 2,

f = 50MHz

7

width (referred to input)
C

S

= 0.1pF

f = 100MHz

12

I

T

C

S

= 0.1 F

f = 150MHz

16

nA

T

f = 50MHz

8

C

S

= 0.4pF

f = 100MHz

13

f = 150MHz

18

PSRR

Power supply rejection ratio (change in V

OS

)

DC Tested,

V

CC

=

±

0.5V

–55

dB

PSRR

Power supply rejection ratio

3

f = 1.0MHz, Test Circuit 3

–20

dB

V

OLMAX

Maximum differential output AC voltage

I

i

= 0–2mA peak AC

800

mV

dR

T

dt

AGC loop time constant parameter

4

10

µ

A to 20

µ

A steps

1

dB/ms

I

INMAX

Maximum input amplitude for output duty
cycle of 50

±

5%

Test circuit 4

+2

mA

t

r

, t

f

Output rise and fall times

10 – 90%

2.2

ns

t

D

Group delay

f = 10MHz

2.2

ns

NOTES:
1. Does not include Miller-multiplied capacitance of input device.
2. Noise performance measured differential. Single-ended output noise is higher due to CM noise.
3. PSRR is output referenced and is circuit board layout dependent at higher frequencies. For best performance use a RF filter in V

CC

line.

4. This implies that the SA5223 gain will change 1dB (10%) in the absence of data for 1ms (i.e., can handle bursty data without degrading Bit

Error Rate (BER) for 100,000 cycles at 100MHz).