Intel 8086-1 - Manual (Page 14)

8086
ABSOLUTE MAXIMUM RATINGS
Ambient Temperature Under Bias 0 C to 70 C
Storage Temperature b 65 C to a 150 C
Voltage on Any Pin with
Respect to Ground b 1 0V to a 7V
Power Dissipation 2 5W
NOTICE This is a production data sheet The specifi-
cations are subject to change without notice
WARNING Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage
These are stress ratings only Operation beyond the
‘‘Operating Conditions’’ is not recommended and ex-
tended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability
D C CHARACTERISTICS (8086 T
A e 0 C to 70 C V
CC e 5V g 10%)
(8086-1 T
A e 0 C to 70 C V
CC e 5V
g
5%)
(8086-2 T
A e 0 C to 70 C V
CC e 5V g 5%)
Symbol Parameter Min Max Units Test Conditions
V
IL
Input Low Voltage b 0 5 a 0 8 V (Note 1)
V
IH
Input High Voltage 2 0 V
CC a 0 5 V (Notes 1 2)
V
OL
Output Low Voltage 0 45 V I
OL e 2 5 mA
V
OH
Output High Voltage 2 4 V I
OH e b 400 mA
I
CC
Power Supply Current 8086 340
8086-1 360 mA T
A e 25 C
8086-2 350
I
LI
Input Leakage Current g 10 m A 0V s V
IN s V
CC
(Note 3)
I
LO
Output Leakage Current g 10 m A 0 45V s V
OUT s V
CC
V
CL
Clock Input Low Voltage b 0 5 a 0 6 V
V
CH
Clock Input High Voltage 3 9 V
CC a 1 0 V
C
IN
Capacitance of Input Buffer 15 pF fc e 1 MHz
(All input except
AD
0
– AD
15
RQ GT)
C
IO
Capacitance of I O Buffer 15 pF fc e 1 MHz
(AD
0
– AD
15
RQ GT)
NOTES
1 V
IL tested with MN MX Pin e 0V V IH tested with MN MX Pin e 5V MN MX Pin is a Strap Pin
2 Not applicable to RQ GT0 and RQ GT1 (Pins 30 and 31)
3 HOLD and HLDA I
LI min e 30 mA max e 500 mA
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