ETS-Lindgren 7405 E & H Near Field Probe Set User Manual
Page 48

48
Common Diagnostic Techniques
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3.
The technique was improperly applied.
4.
An outside factor is involved, such as a second source radiating at the
same frequency.
Example:
A solution that worked in the lab and on the range before
10:00 AM failed later in the day.
Analysis revealed that the rise in temperature was affecting the
values of decoupling capacitors, making them less effective at
higher temperatures.
See also other documents in the category ETS-Lindgren Equipment:
- SMART 200 Reverb Chambers (45 pages)
- 6402 Helmholtz Coil (24 pages)
- 3625-2 LISN (15 pages)
- 3701 Line Probe (15 pages)
- 3725-2M LISN (19 pages)
- 3810-2 LISN (25 pages)
- 3816-2 LISN (21 pages)
- 3850-2 LISN (19 pages)
- 4825-2 LISN (25 pages)
- 1052 Antenna Tower Positioner (23 pages)
- 2005 Single Axis Positioner (32 pages)
- 2090 Controller (178 pages)
- 2110 Multi-Axis Positioning Systems (MAPS) (48 pages)
- 2115 Multi-Axis Positioning Systems (MAPS) (48 pages)
- 2165 Turntable (46 pages)
- 2171B Boresight Antenna Tower (64 pages)
- 2175 Antenna Tower (41 pages)
- 2181 Turntable (44 pages)
- 2187 Turntable (36 pages)
- 2188 Turntable (39 pages)
- 7-TR Tripod Positioner (49 pages)
- 7000-001 EMCenter Modular RF Platform (41 pages)
- 91197-1 Current Probe (57 pages)
- 95236-1 Current Probe (27 pages)
- HI-1501 Microwave Oven Survey Meter (28 pages)
- HI-1600 Microwave Oven Survey Meter (26 pages)
- HI-1710A Microwave Oven Survey Meter (57 pages)
- HI-1801 Microwave Oven Survey Meter (24 pages)
- HI-2200 RF Survey Meter (53 pages)
- HI-2602 Interlock Monitor (22 pages)
- HI-2790B Calibration Comparison System (44 pages)
- HI-3603 VLF Survey Meter (55 pages)
- HI-3604 ELF Survey Meter (44 pages)
- HI-3624(A) Survey Meter (22 pages)
- HI-3627 ELF Magnetic Field Meter (36 pages)
- HI-3637 VLF Magnetic Field Meter (48 pages)
- HI-3638 ELV/VLF Electric Field Meter (41 pages)
- HI-3702 Induced Current Meter (34 pages)
- HI-3804 RF Industrial Compliance Meter (25 pages)
- HI-4416 Numeric EMF Readout Unit (38 pages)
- HI-4433-CH Magnetic Field Probe (42 pages)
- HI-6005 Electric Field Probe (152 pages)
- HI-6100 Field Monitor (71 pages)
- HI-6113 Laser Data Interface and Probe Measurement System (49 pages)