Ocean Optics NanoCalc Software - Manual (Page 2)

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At a Glance
Quick Click Controls
New quick click buttons located just
below the menu give instant control
of the functions you use most
frequently.
Fast Access Routines
Programmable shortcut keys give you
the flexibility to run routines with a
single button. Routines can be
customized making it simple to
create, run and repeat your most
common methods.
Easy Export
The notepad allows you to quickly
and easily export your results to Excel
for post-processing.
Fast Fourier Transform Algorithms
New Fast Fourier Transform (FFT) algorithms deliver faster and more accurate results. FFT
methods determine the frequency of the interference pattern and are most commonly
used for the analysis of thicker layers, usually up to about 100 microns. If the layers have
largely unequal thicknesses, FFT methods can be used to measure the thickness of both
films simultaneously. FFT methods are most suitable for highly refractive surfaces and
give accurate results over a wide thickness range.
New Features
The table below highlights the key, new features in NanoCalc software. Our latest version
has all the things you loved about the old NanoCalc software with a host of new and
improved features that are focused on delivering improved performance and operation.
FFT thickness measurement of a 11.8 µm thick layer of SU8
Contact an application sales
engineer today to find out more.
Feature
Fast Fourier Transform algorithms
Quick Click Controls including sliders for thickness and N&K parameters
Easy interface customization
Easy data export
Extended wavelength range from 197 nm – 1700 nm
Local language software versions
Windows 7 (32-bit and 64-bit compatibility)
Thickness measurements from 10 nm to 250 µm for up to 10 layers
Fast curve fit algorithms in <1 s per measurement
Customized methods with password protection
Green-Yellow-Red light answers for online applications
Large materials database
Vers. 2 & 3 Vers. 4