Devicecontext, Devicecontextbuffer, Devicecontex – Dataman 520 Series User Manual
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Development kit for DATAMAN 520 series
Programmer’s Guide
Parameters:
ShapePrediction
–
true – shape prediction active
false – shape prediction inactive
Return Value:
ERROR_OK – Function call successfuly completed
ERROR_DEVELOPMENT_KIT_NOT_ENABLED – DK can not be used with
connected device (DK was not purchased)
ERROR_USB_COMMUNICATION_FAILED
– USB communication failed
Note:
Shape prediction is used in the sampling mode to predict the waveform shape from
measured samples until all data are collected.
DeviceContext
struct DensityItem {
/* Millivolts per divider */
int fDensity;
/* Value to be filled in the device density registry */
unsigned short int fDensityRegistryCombinationChannelA;
/* Value to be filled in the device reference registry for Probe type 1 */
unsigned short int fReferenceRegistryCombinationProbe1ChannelA;
/* Value to be filled in the device reference registry for Probe type 10 */
unsigned short int fReferenceRegistryCombinationProbe10ChannelA;
/* Value to be filled in the device reference registry for uncalibrated device */
unsigned short int fReferenceRegistryCombinationNoCalibChannelA;
/* Value to be filled in the device density registry */
unsigned short int fDensityRegistryCombinationChannelB;
/* Value to be filled in the device reference registry for Probe type 1 */
unsigned short int fReferenceRegistryCombinationProbe1ChannelB;
/* Value to be filled in the device reference registry for Probe type 10 */
unsigned short int fReferenceRegistryCombinationProbe10ChannelB;
/* Value to be filled in the device reference registry for uncalibrated device */
unsigned short int fReferenceRegistryCombinationNoCalibChannelB;
};
struct DeviceDensitySettings {
/* Count of used values in arrays */
int fItemsCount;
DensityItem fDensityItems[11];
};
struct TimeBaseItem {
/* Period per divider in nanoseconds */
double fTimeBase;
/* Sampling period in nanoseconds */
double fSamplingPeriod;
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