HT instruments HT701 - Manual (Page 9)

HT701
EN - 8
4.2.5. STORE/RECALL key
The STORE/RECALL key carries out the following operations:
 Simply pressing the key allows saving the value on the display in the memory. The
symbol “MEM” flashes for a second and the considered memory location is
immediately indicated on the display. Each measuring function has its own dedicated
memory space for a maximum of 100 available locations for each of them.
 Pressing and holding the key for 2 seconds allows recalling the data saved in the
internal memory on the display. The symbol “MEM” and the indication of the last
memory location are shown on the display together with the measurement result. Press
the keys
 or  to select the desired memory location. Press and hold the keys  or
 for 2 seconds to rapidly select the memory locations.
 Press and hold the MODE key for 2 seconds to delete the whole instrument memory.
The message “nOnE” is shown on the display and the indication of the memory
location is taken back to “0”. As an alternative, press and hold the STORE/RECALL
key while switching on the instrument.
 Press the STORE/RECALL key again or turn the rotary switch to exit the function.
4.2.6. RANGE/50V-1kV
key
Pressing the RANGE/50V-1kV key allows the following operations:
 Manual selection of the measuring range of the different functions (except for positions
, , °C and °F and insulation measurement). The symbol “AUTO” disappears from
the display and the cyclic pressure of the key modifies the position of the decimal point
on the display. Press and hold the RANGE key for 2 seconds or turn the rotary switch
to exit the function and restore the symbol “AUTO” on the display.
 Selecting the test voltage in insulation measurement (see § 4.4.9) among the following
values: 50V, 100V, 250V, 500V and 1000VDC. The symbols of the selected voltages
are shown at the bottom of the display on the right.
 Quitting sub-functions selected on the instrument.
4.2.7. TEST
key
Pressing the TEST key allows activating the insulation resistance measurement on the
instrument (see § 4.4.9).