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Com-Power PS-500 User Manual

Description, Application, Features

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Description

The PS-500 is a Near Field Probe set consist four

probes and a custom storage case. Performance and

ease of use were designed into this product. The unique

design allows easy access for tight or hard to reach

places while reducing the effect of hand position or

cable placement.

The fine tip and the contac tip probe are a precision

E-field probes that features the ability to singularly

identify a problem trace or pin. The fine tip probe is

designed to be extremely sensitive to distance from

the source which allows easy discrimination between

traces on a PCB. The unique patented design allows

measurement on individual traces as narrow as 3 mils.

The contact tip probe allows direct electrical contact

with the circuit. It has wider frequency range than the

fine tip probe. Just like the fine tip probe the contact

tip probe allow finding noise source to a trace or pin.

The broadband probe is designed to identify E-fields

over a broad frequency range.

The H-field probe's magnetic loop design makes it ideal

for isolating sources of magnetic noise. The shielded

loop construction allows measurement to minimize

the effect of electrical fields.

Application

The PS-500 Near Field Probe Set is designed to assist

in troubleshooting EMI problems both at the board

level and at the component level. It is used to detect

radiation from cables, cases, traces and ICs.

Typically the broadband probe is used to locate the

general area of emission. Then the tip probe is used

to isolate the source to a specific trace or pin. Further

analysis can be done using the contact tip probe by

making direct contact with the curcuit and then follow-

ing the noisy trace to find the cause of emissions such

as a broken transmission line or impedance mismatch.

A typical use for the H-field probe is to verify the in-

tegrity of the chassis of your computer. This is done

by moving the probe along the seams of the chassis

which may be acting as slot antennas. This probe is

also very useful for detecting magnetic noise sources

such as large current switching circuits or transformers.

By utilizing the appropriate probes, potential certifica-

tion problems can be discovered and addressed before

expensive compliance testing is done. This saves both

money and valuable time. The net result is a reduction

in testing costs and a decreased time to market.

Features

Complete Solution - Includes E and H field probes
Contact tip probe - Make contact with the circuit
Locate Noise Source - Down to a pin with the fine tip
Lightweight - Easy to use and handle
Small Size - Allows easy access to corners
Sensitive to Tip Position - Ease of pinpointing source
Immune to Hand Position - For repeatable results
Optional preamplifier

PS-500

Near Field Probe Set

Com-Power Corporation

(949) 587 - 9800

www. com-power.com

[email protected]