Rainbow Electronics MAX4880 - Manual (Page 9)

tank circuit and provide protection if necessary to pre-
vent exceeding the 30V absolute maximum rating on IN.
The MAX4880 provides protection against voltage
faults up to 28V, but this does not include negative volt-
ages. If negative voltages are a concern, connect a
Schottky diode from IN to GND to clamp negative input
voltages.
Exposed Pad
The MAX4880 provides an exposed pad on the bottom
of the package. This pad is internally connected to
GND. For the best thermal conductivity and higher
power dissipation, solder the exposed pad to the
ground plane. Do not use the ground-connected pad
as the only electrical ground connection or ground
return. Use GND (pin 6) as the primary electrical
ground connection.
ESD Test Conditions
ESD performance depends on a number of conditions.
The MAX4880 is specified for 15kV typical ESD resis-
tance on IN when IN is bypassed to ground with a 1µF
low-ESR ceramic capacitor. Contact Maxim for a relia-
bility report that documents test setup, methodology,
and results.
Human Body Model
Figure 6 shows the Human Body Model, and Figure 7
shows the current waveform it generates when dis-
charged into a low impedance. This model consists of
a 100pF capacitor charged to the ESD voltage of inter-
est, which is then discharged into the device through a
1.5k
Ω resistor.
IEC 61000-4-2
Since January 1996, all equipment manufactured and/or
sold in the European community has been required to
meet the stringent IEC 61000-4-2 specification. The IEC
61000-4-2 standard covers ESD testing and perfor-
mance of finished equipment; it does not specifically
refer to integrated circuits. The MAX4880 helps users
design equipment that meets Level 3 of IEC 61000-4-2,
without additional ESD-protection components.
The main difference between tests done using the
Human Body Model and IEC 61000-4-2 is higher peak
current in IEC 61000-4-2. Because series resistance is
lower in the IEC 61000-4-2 ESD test model (
Figure 8),
the ESD-withstand voltage measured to this standard is
generally lower than that measured using the Human
Body Model.
Figure 9 shows the current waveform for
the ±8kV IEC 61000-4-2 Level 4 ESD Contact-
Discharge test. The Air-Gap test involves approaching
the device with a charger probe. The Contact-
Discharge method connects the probe to the device
before the probe is energized.
Chip Information
TRANSISTOR COUNT: 2391
PROCESS: BiCMOS
MAX4880
Overvoltage-Protection Controller with
Internal Disconnect Switch
_______________________________________________________________________________________ 9
PART
CONFIGURATION/
PACKAGE
V DS
MAX (V)
R ON
AT 4.5V (m Ω)
MANUFACTURER
Si1426DH Single/SC70-6 30 115
Vishay Siliconix
www.vishay.com
402-563-6866
FDG315N Single/SC70-6 30 160
Fairchild Semiconductor
www.fairchildsemi.com
207-775-8100
Table 1. MOSFET Suggestions