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Emi and environmental type tests, Ruggedserver™ rs910 – RuggedCom RuggedServer RS910 User Manual

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RuggedServer™ RS910

RuggedServer™ RS910

2-Port Serial Device Server with up to 3 Ports Managed Ethernet Switch

EMI and Environmental Type Tests

Environmental Type Tests

Test

Description

Test Levels

Severity Levels

IEC 60068-2-1

Cold Temperature

Test Ad

-40°C, 16 Hours

N/A

IEC 60068-2-2

Dry Heat

Test Bd

+85°C, 16 Hours

N/A

IEC 60068-2-30

Humidity (Damp Heat, Cyclic)

Test Db

95% (non-condensing),

55°C , 6 cycles

N/A

IEC 60255-21-1

Vibration

Tests Fc

2g @ (10 - 150) Hz

Class 2

1

IEC 60255-21-2

Shock

Tests Ea

30g @ 11mS

Class 2

IEC 61000-6-2 EMC Generic Standard: Immunity for Industrial Environments

Test

Description

Levels

RuggedCom Test Level

Performance Criteria*

IEC 61000-4-2

ESD

Enclosure Contact

+/- 4kV

+/- 8kV

B

Enclosure Air

+/- 8kV

+/- 15kV

B

IEC 61000-4-3

Radiated RFI

Enclosure ports

10 V/m, 80 to 1000Mhz

20V/m

A

IEC 61000-4-4

Burst (Fast Transient)

Signal ports

+/- 1kV @ 5kHz

+/- 4kV @ 2.5kHz

B

D.C Power ports

+/- 2kV @ 5kHz

+/- 4kV

B

A.C. Power ports

+/- 2kV @ 5kHz

+/- 4kV

B

IEC 61000-4-5

Surge

Signal ports

+/- 1kV line-to-earth

+/- 2kV line-to-earth, +/- 2kV

line-to-line

B

D.C Power ports

+/- 0.5kV line-to-earth/line +/- 4kV line-to-earth, +/- 2kV

line-to-line

B

A.C. Power ports

+/- 2kV line-to-earth, +/- 1kV

line-to-line

+/- 4kV line-to-earth, +/- 2kV

line-to-line

B

IEC 61000-4-6

Induced (Conducted) RFI

Signal ports

10V @ 0, 5-80 MHz

10V @ 0, 5-80 MHz

A

D.C Power ports

10V @ 0, 5-80 MHz

10V @ 0, 5-80 MHz

A

A.C. Power ports

10V @ 0, 5-80 MHz

10V @ 0, 5-80 MHz

A

Earth ground ports

10V @ 0, 5-80 MHz

10V @ 0, 5-80 MHz

A

IEC 61000-4-8

Magnetic Field

Enclosure ports

30 A/m @ 50, 60 Hz

40 A/m continuous, 1000

A/m for 1s

A

IEC 61000-4-11

Voltage Dips

A.C. Power ports

30% reduction for 0.5

period

30% for 1 period

B

>95% reduction for 250

periods

100% for 5 periods, 100%

for 50 periods

C

IEC 60255-5

Dielectric Strength

Signal ports

2kVac

(Fail-Safe Relay output)

2kVac

(Fail-Safe Relay output)

N/A

D.C. Power ports

2kVac

2kVac

N/A

A.C. Power ports

2kVac

2kVac

N/A

IEC 60255-5

H.V. Impulse

Signal ports

5kV

(Fail-Safe Relay output)

5kV

(Fail-Safe Relay output)

N/A

D.C. Power ports

5kV

5kV

N/A

A.C. Power ports

5kV

5kV

N/A

Notes: 1. Class 2 refers to “Measuring relays and protection equipment for which a very high security margin is required or where the vibration levels are very high, ( e.g. shipboard application and for severe transportation conditions”)

NEMA TS-2 Requirements

Test

Description

Levels

Performance Criteria*

TS-2 1998, Section 2, para 2.2.7.3

Temperature: Low Temperature/Low

Voltage

89.0 VAC @ -34°C

EUT Continued to function properly during

and following all temperature and humidity

testing

TS-2 1998, Section 2, para 2.2.7.4

Temperature: Low Temperature/High

Voltage

135.0VAC @ -34°C

TS-2 1998, Section 2, para 2.2.7.5

Temperature: High Temperature/High

Voltage

135.0VAC @ + 75°C

TS-2 1998, Section 2, para 2.2.7.6

Temperature: High Temperature/Low

Voltage

89.0VAC @ + 75°C

TS-2 1998, Section 2 para. 2.2.8.4

Vibration Endurance Test

0.5g @ 30Hz for 1hr on all three planes

EUT functioned properly following test pro-

cedure. No physical damage.

TS-2 1998, Section 2, para 2.1.10

Mechanical Shock

+/-10g half sine wave for 11msec on all

three planes

EUT functioned properly following test pro-

cedure. No physical damage.

TS-2 1992, Section 2, para. 2.1.6.1

Electrical Transients: High Repetition Noise

(AC Terminals)

One +/-300VDC pulse every other cycle

once every 3 seconds across 360 ° of line

cycle (2500W peak)

EUT functioned properly during and follow-

ing test procedure. No damage

TS-2 1998, Section 2 para. 2.1.6.2

Electrical Transients: Low-Repetition High

Energy (AC Terminals

One +/-600VDC pulse every second, ran-

domly distributed across 360 ° of line cycle.

Ten pulses total.

EUT functioned properly during and follow-

ing test procedure. No damage

TS-2 1998, Section 2, para 2.1.7

Electrical Transients: I/O Terminals

One +/-300VDC pulse every second, mini-

mum 5 pulses per port

EUT functioned properly during and follow-

ing test procedure. No damage

TS-2 1992, Section 2, para. 2.1.8

Electrical Transients: Nondestruct Transient

Immunity (AC Terminals)

One +/-1000VDC pulse every two seconds,

3 per each polarity.

EUT functioned properly following test pro-

cedure. No damage