Test information, Figure 8, Cbt3126 – NXP Semiconductors CBT3126 User Manual
Page 6: Nxp semiconductors, Quad fet bus switch
CBT3126_4
© NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 04 — 12 October 2009
6 of 13
NXP Semiconductors
CBT3126
Quad FET bus switch
12. Test information
Test data is given in
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 8.
Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aae331
V
EXT
V
CC
V
I
V
O
DUT
CL
RT
RL
RL
G
Table 9.
Test data
Supply voltage
Input
Load
V
EXT
V
CC
V
I
t
r
, t
f
C
L
R
L
t
PLH
, t
PHL
t
PLZ
, t
PZL
t
PHZ
, t
PZH
4.5 V to 5.5 V
GND to 3.0 V
≤
2.5 ns
50 pF
500
Ω
open
7.0 V
open