FUJITSU MHV2060BH - Manual (Page 144)

Interface
5-68 C141-E224
• Current Span under test
As the self-test progress, the device shall modify this value to contain the test
span number currently being tested.
• Feature Flags
Table 5.23 Selective self-test feature flags
Bit Description
0 Vendor specific (unused)
1 When set to one, perform off-line scan after selective test
2 Vendor specific (unused)
3 When set to one, off-line scan after selective test is pending.
4 When set to one, off-line scan after selective test is active.
5...15 Reserved
Bit [l] shall be written by the host and returned unmodified by the device. Bit
[3:4] shall be written as zeros by the host and the device shall modify them as the
test progress.
• Selective Self-test pending time [min]
The selective self-test pending time is the time in minutes from power-on to the
resumption of the off-line testing if the pending bit is set.