Command examples, Example 1: request device identification, Example 2: request an e-field reading – ETS-Lindgren 7000-001 EMCenter Modular RF Platform User Manual
Page 35: Example 3: request a power value

www.ets-lindgren.com
Remote Control of the EMCenter
35
If a card slot supports more than one device, the device ID is the slot number,
followed by the port number of that card slot. For example, using the previous
table:
To access the second EMPower in slot 3: Use device ID number 3B.
To access the EMLink in slot 2: Use device ID number 2.
Command Examples
E
XAMPLE
1:
R
EQUEST
D
EVICE
I
DENTIFICATION
To request the identifier of the EMSwitch card in slot 1:
1:*IDN?
E
XAMPLE
2:
R
EQUEST AN
E-F
IELD
R
EADING
To request an E-field reading from the EMSense card in slot 4
4:D2
E
XAMPLE
3:
R
EQUEST A
P
OWER
V
ALUE
To request a power value from the EMPower sensor connected to port B of the
card in slot 3:
3B:POWER?
See also other documents in the category ETS-Lindgren Equipment:
- SMART 200 Reverb Chambers (45 pages)
- 6402 Helmholtz Coil (24 pages)
- 3625-2 LISN (15 pages)
- 3701 Line Probe (15 pages)
- 3725-2M LISN (19 pages)
- 3810-2 LISN (25 pages)
- 3816-2 LISN (21 pages)
- 3850-2 LISN (19 pages)
- 4825-2 LISN (25 pages)
- 1052 Antenna Tower Positioner (23 pages)
- 2005 Single Axis Positioner (32 pages)
- 2090 Controller (178 pages)
- 2110 Multi-Axis Positioning Systems (MAPS) (48 pages)
- 2115 Multi-Axis Positioning Systems (MAPS) (48 pages)
- 2165 Turntable (46 pages)
- 2171B Boresight Antenna Tower (64 pages)
- 2175 Antenna Tower (41 pages)
- 2181 Turntable (44 pages)
- 2187 Turntable (36 pages)
- 2188 Turntable (39 pages)
- 7-TR Tripod Positioner (49 pages)
- 7405 E & H Near Field Probe Set (51 pages)
- 91197-1 Current Probe (57 pages)
- 95236-1 Current Probe (27 pages)
- HI-1501 Microwave Oven Survey Meter (28 pages)
- HI-1600 Microwave Oven Survey Meter (26 pages)
- HI-1710A Microwave Oven Survey Meter (57 pages)
- HI-1801 Microwave Oven Survey Meter (24 pages)
- HI-2200 RF Survey Meter (53 pages)
- HI-2602 Interlock Monitor (22 pages)
- HI-2790B Calibration Comparison System (44 pages)
- HI-3603 VLF Survey Meter (55 pages)
- HI-3604 ELF Survey Meter (44 pages)
- HI-3624(A) Survey Meter (22 pages)
- HI-3627 ELF Magnetic Field Meter (36 pages)
- HI-3637 VLF Magnetic Field Meter (48 pages)
- HI-3638 ELV/VLF Electric Field Meter (41 pages)
- HI-3702 Induced Current Meter (34 pages)
- HI-3804 RF Industrial Compliance Meter (25 pages)
- HI-4416 Numeric EMF Readout Unit (38 pages)
- HI-4433-CH Magnetic Field Probe (42 pages)
- HI-6005 Electric Field Probe (152 pages)
- HI-6100 Field Monitor (71 pages)
- HI-6113 Laser Data Interface and Probe Measurement System (49 pages)