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Nova-Tech iPR-Series User Manual

Ipr-series, Schmidt, Haensch

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iPR-Series

SCHMIDT

+

HAENSCH

Opto-electronic measuring devices since 1864

In-Line immediate concentration monitoring directly in the process steam in less then 1 sec.

Applications:

tConcentration monitoring
tProduct interface detection
tDeviation from the nominal value
(Quality control)
tCrystallization monitoring
tDosage control
t'FSNFOUBUJPODPOUSPM

Industries:

t'PPE#FWFSBHF
t$IFNJTUSZ
t1IBSNBDFVUJDBMT
t4VHBS1SPEVDUJPO
t5FYUJMFBOE1BQFS
t4FNJDPOEVDUPST
t$PPMJOH-VCCSJDBOU"HFOUT