Texas Instruments SLUU477 - Manual (Page 4)

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2 Test Summary
2.1 Definitions
This procedure details how to configure the HPA678 evaluation board. On the test procedure, the
following naming conventions are followed.
VXXX : External voltage supply name (VBUS, VBAT)
LOADW: External load name (LOADR, LOADI)
V(TPyyy): Voltage at internal test point (TPyyy). For example, V(TP1) means the voltage at TP1.
V(Jxx): Voltage at jack terminal (Jxx).
V(XXX): Voltage at (XXX). For example, V(VDPM) means the voltage at the test point which is
marked "VDPM".
V(XXX, YYY): Voltage across point XXX and YYY.
I(JXX(YYY)): Current going out from the YYY terminal of jack XX.
Jxx(BBB): Terminal or pin BBB of jack xx
Jxx ON : Internal jumper Jxx terminals are shorted
Jxx OFF: Internal jumper Jxx terminals are open
Jxx (-YY-) ON: Internal jumper Jxx adjacent terminals marked as "YY" are shorted
Measure: → A,B Check specified parameters A, B. If measured values are not within specified limits the
unit under test has failed.
Observe → A,B Observe if A, B occur. If they do not occur, the unit under test has failed.
Assembly drawings have location for jumpers, test points and individual components
2.2 Safety
1. Safety Glasses are to be worn.
2. This test must be performed by qualified personnel trained in electronics theory and understand the
risks and hazards of the assembly to be tested.
3. ESD precautions must be followed while handling electronic assemblies while performing this test.
4. Precautions should be observed to avoid touching areas of the assembly that may get hot or present a
shock hazard during testing.
2.3 Quality
1. Test data shall be made available upon request by Texas Instruments.
2.4 Apparel
1. Electrostatic smock
2. Electrostatic Gloves or finger cots
3. Safety Glasses
4. Ground ESD wrist strap
4 800mA, Single-Input, Single Cell Li-Ion Battery Solar Charger with Power Path SLUU477 – December 2010
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