Agilent Technologies PN 8510-16 - Manual (Page 9)

9
Using test port 1 calibrations on test port 2
In most cases, port 1 will be the input port of the
DUT. When port 2 must be used as the input port
to the device, the user may choose to use a port 1
flatness-correction calibration on port 2 since the
port 1 and port 2 signal paths are symmetrical.
1
Figure 3 illustrates the use of port 1 flatness cor-
rection on both ports 1 and 2. The port 2 measure-
ment with port 1 flatness-correction calibration is
optimized for measurements below 30 GHz.
1. Test sets with option 003 (high forward dynamic range) cannot be used because
the reverse transmission dynamic range is degraded.
Flatness corrections in fixture or wafer-probing
environments
Test port flatness correction may be applied
with any other power function. Power slope may
be used to compensate for the path loss in non-
coaxial environments such as microstrip and
coplanar waveguide measurement systems. The
maximum test port power for any particular fre-
quency span cannot exceed the maximum test port
power level for the highest frequency in the span
(see Table 3) minus the maximum power slope
compensation required.
Figure 3. Corrected test port power using port 1 flatness correction on port 1
(channel 1) and port 2 (channel 2)