Reliability test, 5 0.5h 3h, Transducer – BeStar SMT5050-03H03-02 LF User Manual
Page 4: Bestar electronics industry co.,ltd

3.1 high temperature test
Temperature +80
°C
Duration 240hrs
3.2 low temperature test
Temperature -30
°C
Duration 240hrs
3.3 life test in normal temperature
Temperature 25
±10°C
Power supply 3.0Vo-p squarewave 1/2 duty 4kHz
Duration 240hrs
3.4 Thermal shock
Cycles 50
3.5 Humidity cycle test
Cycles 5
+85 C
30min
3.6 High Temp. life
Temp. +70
°C
Power supply 4.0Vo-p Square wave1/2duty 4kHz
Duration 240hrs
3.7Low Temp. life
Temp. -30
°C
Power supply 3.0Vo-p Square
wave 1/2duty 4kHz
Duration 240hrs
30min
-40
°C
3.Reliability Test
+25 C
3h
a
b
12.5 0.5h
3h
c
24h
+55 C
a,c :95-100%RH
b : 90-96%RH
Cycles 6
1
2
3
H
G
F
E
D
C
B
2
1
3
Page:04 of 09
A
Transducer
4
5
6
H
G
F
E
D
C
Drawn by:
Date:
B
Note
Approved by:
4
Drawn
5
BESTAR ELECTRONICS INDUSTRY CO.,LTD
REV.
6
Date
A
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SMT5050-03H03-02 LF
SMT5050-03H03-02 LF
博
士
達
A
08/03/07
徐 波
陶红仲
DRG NO: BS/TET01.530B
B
09/08/06
魏奉玲
高 正
魏奉玲
09/08/06
characteric
standardized