JDS Uniphase Module-E 10G - Manual (Page 2)

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COMMUNICATIONS TEST &
MEASUREMENT SOLUTIONS
Product specifications and descriptions in this document subject to change without notice. © 2008 JDS Uniphase Corporation 30149137 001 0408 ONT-10GigE.SS.OPT.TM.AE April 2008
Applications
10GigE LAN, 10G FC Testing
10GigE LAN BERT with A/-B seed •
10G FC BERT with A-/B-seed •
10GigE LAN with MAC/IP traffic •
Sophisticated PCS layer testing with •
dynamic block errors, coding statistics and
block capture
256 MAC/IP Flows with 256 independent •
filters
10 mixed VLAN / MPLS tags •
Enhanced Ethernet Frames VPLS, MAC-in- •
MAC
QoS, service disruption, packet jitter, BERT •
per flow
Tree different types of packet jitter: •
Instantaneous, RFC3550 and absolute
Online hitless traffic control •
IPv4/IPv6 and packet capture •
10GigE WAN, 10G SONET/SDH Testing
OC-192c/STM-64c BERT and WAN •
Full 10GigE functionality in WAN as per •
10GigE LAN
Dynamic error/alarm insertion including •
pulse bursts
Best-in-class service disruption with high •
level of details
All pointer sequences •
Performance monitoring G.826/828/829 •
Byte capture all SOH/TOH bytes •
Multi-Channel 10G High Order
Generation and analysis of up to 192xSTS- •
1/64xAU-3/4
Analysis of BER, service disruption, errors, •
alarms in all channels
Mixed mappings •
STS-1 /3c/6c/9c/12c/24c/48c/192c •
VC-4-2c/3c/4c/8c/16c/64c •
Enhanced through mode with error and •
alarm injection in multiple channels
Dynamic error/alarm insertion including •
pulse bursts
Best-in-class service disruption with high •
level of details
Byte capture all SOH/TOH bytes •
OTN OTU2 10/11G Testing
Standard and overclocked OTU2 line rates •
OTN wrapper/dewrapper testing (RX <> •
TX rates)
Support of all TCM layers •
Transfer delay and service disruption •
Unique FEC stress testing with walking •
pattern
OH byte capture •
Dynamic error/alarm insertion including •
pulse bursts
Stressed Eye and Jitter/Wander Testing
(in preparation)
Stressed eye (SE) generation at all •
unframed and framed rates at 1550 nm
User-adjustable OMA, ER, SJ, and VECP •
Stressed receiver sensitivity (SRS) test with •
pass/fail result using bit error ratio (BER)
measurement
Jitter/wander generation and analysis for •
all line rates
Framed and unframed signals with optical •
and differential electrical interfaces
TDEV noise wander generation for all •
interfaces incl. DS1/E1
Automatic measurements MTJ, FMTJ, JTF, •
MTW, WTF
Online TIE/MTIE/TDEV wander •
measurements
Multiple Applications
for Multiple Users
Combining broadest range of technol-
ogies with real multi-user capabilities
the JDSU ONT-503/506/512 is the lab
tool enabling users to get the most out
of their testing time.
Highly developed Tcl- and C-libraries
together with LW CVI drivers facilitate
and speed the development of auto-
mated test scripts
40/43G with Jitter
For analyzing electrical and optical
40/43 Gb/s SDH/SONET/OTU-3 systems
including jitter and wander functional-
ity in one unit.
High Accurate Jitter up to 10.7 Gb/s
For qualifying electrical and optical
inputs and outputs of systems 155M up
to 10.7 Gb/s. The jitter receiver provides
the highest accuracy on the market.
The solution complies to ITU-T O.172
Appendix VII and VIII. Wander measure-
ments are processes with up to 1000
samples/s.
OTN all rates
For system testing with all G.709 map-
pings OTU-1/2/3 and overclocked
OTU-2. Various clients are supported
together with the wrapper/de-wrapper
test functionality
Ethernet up to 10GigE
For testing native Ethernet inter-
faces 10/100/1000M and GigE and
verifying real interworking with the
NewGen solution. 10GigE LAN/WAN
allows enhanced testing on PCS and
MAC/IP layers.
MultiChannel Low Order
Analyses all 1000 channels of a 2.5 Gb/s
bandwidth in 2.5 and 10 Gb/s signals.
Uses multiple service disruption mea-
surements to see all detailed effects
during switching processes in SDH/
SONET systems. No blind spots.