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Electrical characteristics – Diodes AP2301/AP2311 User Manual

Page 4

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AP2301/AP2311

Document number: DS32241 Rev. 5 - 2

4 of 18

www.diodes.com

February 2014

© Diodes Incorporated

AP2301/AP2311


Electrical Characteristics

(@T

A

= +25°C, V

IN

= +5V, C

IN

= 0.1µF, C

L

= 1µF, unless otherwise specified.)

Symbol

Parameter

Test Conditions

Min

Typ

Max

Unit

V

UVLO

Input UVLO

V

IN

rising

1.6 2.0 2.4 V

∆V

UVLO

Input UVLO Hysteresis

V

IN

decreasing

50 mV

I

SHDN

Input Shutdown Current

Disabled, OUT = open

0.1

1

µA

I

Q

Input Quiescent Current

Enabled, OUT = open

60

100

µA

I

LEAK

Input Leakage Current

Disabled, OUT grounded

0.1

1

µA

I

REV

Reverse Leakage Current

Disabled, V

IN

= 0V, V

OUT

= 5V, I

REV

at V

IN

0.01 1 µA

R

DS(ON)

Switch on-resistance

V

IN

= 5V, I

OUT

= 2.0A

T

A

= +25°C

70 84

mΩ

-40°C ≤ T

A

≤ +85°C

105

V

IN

= 3.3V, I

OUT

= 2.0A

T

A

= +25°C

90

108

-40°C ≤ T

A

≤ +85°C

135

I

LIMIT

Over-Load Current Limit (Note 6) V

IN

= 5V, V

OUT

= 4.5V

-40°C ≤ T

A

≤ +85°C

2.05 2.50 2.85 A

I

Trig

Current limiting trigger threshold Output Current Slew rate (<100A/s)

2.5

A

I

SHORT

Short-Circuit Current Limit

Enabled into short circuit

2.75

A

T

SHORT

Short-circuit Response Time

V

OUT

= 0V to I

OUT

= I

LIMIT

(OUT shorted to ground)

2 µs

V

IL

EN Input Logic Low Voltage

V

IN

= 2.7V to 5.5V

0.8

V

V

IH

EN Input Logic High Voltage

V

IN

= 2.7V to 5.5V

2 V

I

LEAK-EN

EN Input leakage

V

IN

= 5V, V

EN

= 0V and 5.5V

0.01 1 µA

I

LEAK-O

Output leakage current

Disabled, V

OUT

= 0V

0.5 1 µA

T

D(ON)

Output turn-on delay time

C

L

= 1µF, R

LOAD

= 5Ω

0.1 ms

T

R

Output turn-on rise time

C

L

= 1µF, R

LOAD

= 5Ω

0.6

1.5

ms

T

D(OFF)

Output turn-off delay time

C

L

= 1µF, R

LOAD

= 5Ω

0.1 ms

T

F

Output turn-off fall time

C

L

= 1µF, R

LOAD

= 5Ω

0.05

0.1 ms

R

FLG

FLG output FET on-resistance

I

FLG

= 10mA

20 40 Ω

I

FOH

FLG Off Current

V

FLG

= 5V

0.01 1 µA

T

Blank

FLG blanking time

Assertion or deassertion due to overcurrent and over-
temperature condition

4 7 15

ms

T

DIS

Discharge time

C

L

= 1µF, V

IN

= 5V, disabled to V

OUT

< 0.5V

0.6

ms

R

DIS

Discharge resistance (Note 7)

V

IN

= 5V, disabled, I

OUT

= 1mA

100 Ω

T

SHDN

Thermal Shutdown Threshold

Enabled

140

°C

T

HYS

Thermal Shutdown Hysteresis

20

°C

θ

JA

Thermal Resistance Junction-to-
Ambient

SO-8 (Note 8)

96

°C/W

MSOP-8 (Note 8)

130

°C/W

MSOP-8-EP (Note 9)

92

°C/W

U-DFN3030-8 (Note 9)

84

°C/W

U-DFN2020-6 (Note 10)

90

°C/W

Notes:

6. Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account separately.

7. The discharge function is active when the device is disabled (when enable is de-asserted or during power-up power-down when V

IN

< V

UVLO

).

The discharge function offers a resistive discharge path for the external storage capacitor for limited time.

8. Device mounted on 2” x 2” FR-4 substrate PCB, 2oz copper, with minimum recommended pad layout.

9. Device mounted on 2” x 2” FR-4 substrate PCB, 2oz copper, with minimum recommended pad on top layer and thermal vias to bottom layer ground

plane.

10. Device mounted on 1"x1" FR-4 substrate PCB, 2oz copper, with minimum recommended padon top layer and thermal vias to bottom layer ground.